ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,582, issued on April 14, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan). "Detection system, compensation method, and computer read... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,583, issued on April 14, was assigned to Apple Inc. (Cupertino, Calif.). "Multi-channel self-mixing interferometric sensor" was invented b... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,584, issued on April 14, was assigned to MITUTOYO Corp. (Kanagawa, Japan). "Measurement method of surface shape and surface shape measurem... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,585, issued on April 14, was assigned to ASM IP Holding B.V. (Almere, Netherlands). "Endpoint detection method for chamber component refur... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,586, issued on April 14, was assigned to OMRON Corp. (Kyoto, Japan). "Floor surface condition detection device, distance measuring device ... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,587, issued on April 14, was assigned to CKD Corp. (Aichi, Japan). "Three-dimensional measurement device" was invented by Hiroyuki Ishigak... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,588, issued on April 14, was assigned to TWINPORT360 HOLDING B.V. (Varsseveld, Netherlands). "Device and method for determining the three-... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,589, issued on April 14, was assigned to HEXAGON INNOVATION HUB GMBH (Heerbrugg, Switzerland). "Measuring system providing shape from shad... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,590, issued on April 14, was assigned to Honeywell International Inc. (Charlotte, N.C.). "Method to control gap for sheet manufacturing me... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,591, issued on April 14, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Distance measuring device, distance measur... Read More